000011732 001__ 11732
000011732 005__ 20141205155941.0
000011732 04107 $$aeng
000011732 046__ $$k2008-10-12
000011732 100__ $$aStokoe II, Kenneth H.
000011732 24500 $$aDeep Downhole Seismic Testing for Earthquake Engineering Studies

000011732 24630 $$n14.$$pProceedings of the 14th World Conference on Earthquake Engineering
000011732 260__ $$b
000011732 506__ $$arestricted
000011732 520__ $$2eng$$aDownhole seismic testing is one field test that is commonly used to determine compression-wave (P) and shearwave (S) velocity profiles in geotechnical earthquake engineering investigations. These profiles are required input in evaluations of the responses to earthquake shaking of geotechnical sites and structures at these sites. In the past, traditional downhole testing has generally involved profiling in the 30- to 150-m depth range. As the number of field seismic investigations at locations with critical facilities has increased, profiling depths have also increased. An improved downhole test that can be used for wave velocity profiling to depths of 300 to 600 m or more is presented. The improvements include: (1) a more powerful seismic source, (2) generation of a simple and readily-identifiable sinusoidal waveform, and (3) post-processing of the time-domain records to increase signal-to-noise ratios at deeper depths. The equipment, test procedure and signal processing used in the improved test are discussed. Examples of raw and processed time-domain records at depths ranging from 317 to 427 m are presented. P- and S-wave travel time plots and the interpreted wave velocity profiles measured to a depth of 427 m in one borehole are shown to illustrate the profiling capabilities.

000011732 540__ $$aText je chráněný podle autorského zákona č. 121/2000 Sb.
000011732 653__ $$aField Seismic Testing, Downhole Test, Deep Profiling, Wave Velocities, Sinusoidal Waveform, Signal-to-Noise Ratio

000011732 7112_ $$a14th World Conference on Earthquake Engineering$$cBejing (CN)$$d2008-10-12 / 2008-10-17$$gWCEE15
000011732 720__ $$aStokoe II, Kenneth H.$$iLi, Songcheng$$iCox, Brady R.$$iMenq, Farn-Yuh$$iRohay, Alan
000011732 8560_ $$ffischerc@itam.cas.cz
000011732 8564_ $$s2116376$$uhttps://invenio.itam.cas.cz/record/11732/files/11-0068.pdf$$yOriginal version of the author's contribution as presented on CD, Paper ID: 11-0068.
000011732 962__ $$r9324
000011732 980__ $$aPAPER