Interface morphology of thin films: electrohydrodynamic vs electrokinetic model

Abstract eng:
Dynamics and morphological evolution of thin liquid films (thickness<100 nm) are numerically investigated using electrohydrodynamic (EHD) and electrokinetic (EK) models. In the EHD patterning process, the thin film is typically considered as either perfect dielectric (PD) or leaky dielectric (LD) and the EHD model can be used to investigate the spatiotemporal evolution of the thin film. In the case of having a finite diffuse layer of charges accumulated at the interface (i.e. double layer), the EK model is applied. The effect of the ionic strength of an ionic liquid film which is determined by its molarity is included in the EK model. The 3-D nonlinear thin film equation is solved numerically resulting in spatiotemporal evolution of interface.

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