Stress Fields Induced by Dislocation Loops in Isotropic Cunb Film-substrate System

Abstract eng:
Based on linear superposition rules and fast discrete Fourier transformation, a semi-analytical solution is developed for calculating the elastic fields induced by dislocation loops in an isotropic thin CuNb film-substrate system. The elastic field problem of thin film-substrate system is decomposed into two sub-problems: bulk stress due to a dislocation loop in an infinite space, and correction stress induced by free surface and interface of the film-substrate system. Thus, continuous displacement and traction stress across the interface plane of the perfectly- bounded film-substrate system are generated. Elastic fields of dislocation loops within Cu film and Nb substrate of the Cu—Nb film-substrate system are analyzed, and it is found that the elastic fields of dislocation loop are influenced remarkably by film thickness.

• Export as: BibTeX | MARC | MARCXML | DC | EndNote | NLM | RefWorks
• Add to your basket