Particles double layer evaluation by atomic force microscopy- optical tweezers

Abstract eng:
Atomic force microscopy (AFM) is the most commonly used method of direct force evaluation, but due to its technical limitations this single probe technique is unable to detect forces with femtonewton resolution. We present the development of a combined atomic force microscopy and optical tweezers (AFM/OT) instrument. The optical tweezers system provides us the ability to manipulate small dielectric objects and to use it as a high spatial and temporal resolution displacement and force sensor in the same AFM scanning zone. We demonstrate the possibility to develop a combined instrument with high potential in nanomechanics, molecules manipulation and biological studies. The presented study is aimed to quantify the interaction forces between two single polystyrene particles in the femtonewton scale by using the developed AFM/OT equipment.

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