Large scale atomistic simulation of size effects during nanoindentation

Abstract eng:
Size effects in a Ni single crystal thin film during nanoindentation experiment are studied using large scale atomistic simulation. The main focus of this paper is to evaluate the presented size effects theories of nanoindentation experiment using atomistic simulation. The hardness obtained directly from MD simulation is compared with the one which is determined using the dislocation density and theoretical models. Next, sources of size effects in nanoscale thin films are studied. A Ni single crystal thin film is indented using a conical indenter with a spherical tip. The final step is to investigate the size effects sources using the microstructural information obtained from MD simulation. The results show that the initial governing mechanism of size effects is source exhaustion. Increasing the indentation depth, the total dislocation length also increases which activates the forest hardening model and Taylor hardening model can successfully capture the size effects at higher indentation depths.

• Export as: BibTeX | MARC | MARCXML | DC | EndNote | NLM | RefWorks
• Add to your basket