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The Institute of Theoretical and Applied Mechanics
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Original version of the author's contribution as presented on CD, page 3150, code TS.FS03-3.01 .:
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Micro-speckle/grating by FIB deposition and their application to deformation measurement (INVITED)
Xie, Huimin
Deformation carriers-speckle and grating are essential components for deformation measurement using the digital image correlation (DIC) and moiré techniques. In order to [...]
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Xie, Heping
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