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1.	Original version of the author's contribution as presented on CD, SOL. : PDF Height profile measurement by means of white-light interferometry Pavlíček, P. White-light interferometer allows to measure the height profile of smooth as well as of rough surfaces. This feature renders white-light interferometry suitable for heigh [...] Detailed record - Similar records
2.	Original version of the author's contribution as presented on CD, . : PDF PROFILOMETRIE POMOCÍ INTERFERENCE BÍLÉHO SVĚTLA Pavlíček, Pavel Abstrakt: Profilometrie pomocí interference bílého světla je metoda vhodná pro proměřování topologie technických povrchů. Jedná se o bezkontaktní optickou me [...] Detailed record - Similar records

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1	Pavlíček, Pavel

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