The Institute of Theoretical and Applied Mechanics 1 records found  Search took 0.06 seconds. 
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Pavlíček, Pavel
Abstrakt: Profilometrie pomocí interference bílého světla je metoda vhodná pro proměřování topologie technických povrchů. Jedná se o bezkontaktní optickou me [...]

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1 Pavlíček, P.
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